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First 3D real-time imaging of hydrogen's effect on stainless steel defects opens the way to a safer hydrogen economy

A study led by University of Oxford and Brookhaven National Laboratory researchers has uncovered how exposure to hydrogen atoms dynamically alters the internal structure of stainless steel. The ...
Nasdaq

Applied Materials Accelerates Chip Defect Review with Next-Gen eBeam System

SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
Nasdaq

Applied Materials Unveils SEMVision™ H20 for Enhanced Nanoscale Defect Analysis in Semiconductor Manufacturing

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
Semiconductor Engineering

Achieving Zero Defect Manufacturing Part 1: Detect & Classify

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...