X-ray fluorescence is a particularly versatile tool as it can be used to examine the composition of materials, yet can also be used for measuring the thickness of very thin metallic coatings. X-Ray ...

During the manufacture of semiconductor wafers, thickness measurement forms an important part of this process, since it provides process engineers with the information required to ensure that ...

Researchers at the University of Illinois, US, have developed an automated optical film-thickness measurement technique that they claim is both inexpensive and non-intrusive. Precise measurements of ...

Multilayer dielectric stacks are used in various applications that demand accurate optical filtration, such as the military, aerospace, architectural glass, and all forms of optical metrology ...

Optical coherence tomography can improve quality control and development of coated dosage forms by allowing film thickness to be measured in real time. The pharmaceutical coating process is a ...

Thin films are two-dimensional (2D) material layers deposited on a bulk substrate, possessing a thickness of a few nanometers to impart properties that cannot be realized by base materials. The unique ...